getReflex-S – high reflectivity specular reflectance standard




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The getReflex-S Specular Reflectance Standard is a mirrored, fused-silica standard that can be used as a reference when measuring surfaces with high specular reflectance values such as optical substrates, optical coatings, machined metals and semiconductor materials. The getReflex-S provides an ~85-90% reflectance across the 200-800 nm wavelength range and an ~85-98% reflectance across the 800-2500 nm range.

The getReflex-S substrate measures 1.25" in diameter and is housed in a sturdy 1.5" x 0.75" blue anodized aluminum enclosure and protected by a screw-on top.

Technical Specification
Substrate Dimensions1.25" outer diameter x 0.25" height
Housing Dimensions1.5" outer diameter x 0.75" height
Reflectance materialmirrored, fused-silica with protective overcoat
Reflectivity~85-90% (200-800 nm)
~85-98% (800-2500 nm



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